IEEE Design & Test of Computers · 1989 · 15 citations · 11 references
EngineeringComputer EngineeringComputer ScienceComputer ArchitectureDesign AutomationDesign For TestabilityDesign For ScanabilityMaintenance Cost OptimizationScan Chain DesignScan Design
The authors describe scan path, NEC's implementation of the scan design approach to design for testability. Designers at NEC have found that scan path greatly contributes to the reduced testing and maintenance cost of their products. The authors discuss several implementations of scan design and compare four implementations, including two scan-path techniques.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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Built-in logic block observation techniques
B. Koenemann · Medical Entomology and Zoology · 1979 · 445 citations
Design for testability—A survey
T.W. Williams, Kenneth P. Parker · Proceedings of the IEEE · 1983 · 393 citations
Logic Testing and Design for testability
Computer-Aided Design · 1986 · 324 citations