Solid-State Electronics · 2005 · 34 citations · 21 references
EngineeringElectrical EngineeringMaterials ScienceElectronic MaterialsMicroelectronicsSemiconductor DevicesDevice CharacterizationDevice ModelingNonlinear Circuit AnalysisSemiconductor Device MaterialsSemiconductor PhysicsWide-bandgap Semiconductor DevicesCapacitanceCapacitance ModelingCapacitance-voltage CharacteristicsGallium Nitride (Gan) MaterialsMetal-oxide-semiconductor Field-effect Transistor ModelingMosfet ModelingPolarizationSemiconductor Device Modeling
21
Optical constants of epitaxial AlGaN films and their temperature dependence
Daniel Brunner, H. Angerer, E. Bustarret et al. · Journal of Applied Physics · 1997 · 601 citations