Publication | Closed Access
Review of technology for 157-nm lithography
60
Citations
2
References
2001
Year
Materials ScienceMaterials EngineeringCritical IssuesEngineeringElectron-beam LithographyBeam LithographyMicrofabricationFabrication TechniqueApplied Physics157-Nm LithographyMask MaterialsSemiconductor Device FabricationNanolithographyNanofabricationElectronic PackagingMicroelectronicsNanolithography Method
This paper outlines the critical issues facing the implementation of 157-nm lithography as a sub-100-nm technology. The status of the present technology for mask materials, pellicles, optical materials, coatings, and resists is presented.
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