Publication | Closed Access
Microwave noise performance of InP/InGaAs heterostructure bipolar transistors
35
Citations
16
References
1989
Year
Electrical EngineeringSemiconductor DeviceEngineeringRf SemiconductorPhysicsNoise PerformanceElectronic EngineeringApplied PhysicsNoiseModified Hawkins ModelMicrowave Noise PerformanceEmitter SizeMicroelectronicsMicrowave EngineeringElectromagnetic Compatibility
The authors report the first low-noise InP/InGaAs heterostructure bipolar transistor (HBT). Minimum noise figures of 0.46, 2.0, and 3.33 dB were measured at 2, 10, and 18 GHz, respectively. The noise performance of this InP/InGaAs HBT with an emitter size of 3.5*3.5 mu m/sup 2/ is compared to that for FETs having a 1- mu m gate length. The measured minimum noise figures agree well with calculated data using a modified Hawkins model. Broadband low-noise operation is observed because of the short transit time for injected nonequilibrium electrons to transverse the base and collector depletion region.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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