Concepedia

Publication | Closed Access

The effects of operating bias conditions on the proton tolerance of SiGe HBTs

DOI

35

Citations

14

References

2003

Year

Shiming Zhang, John D. Cressler, Guofu Niu, Cheryl J. Marshall, Paul W. Marshall, Hak Kim, Robert A. Reed, Michael J. Palmer, Alvin Joseph, D.L. Harame
Solid-State Electronics

References

YearCitations

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