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Low frequency noise characterization in 0.13 μm p-MOSFETs. Impact of scaled-down 0.25, 0.18 and 0.13 μm technologies on 1/f noise

Low-power ElectronicsElectrical EngineeringμM TechnologiesScaled-down 0.25EngineeringElectronic EngineeringNoiseμM P-mosfetsMicroelectronics