Semiconductor Science and Technology · 1990 · 41 citations · 5 references
EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsInterface ScienceSemiconductor MaterialsElectrical CharacterizationElectron MicroscopyMetal-semiconductor ContactsNanomaterial CharacterizationSemiconductor InterfacesSemiconductor NanomaterialsAtomic-scale Surface ImagingBarrier MaterialsBarriersSpatial Resolution Measurement
The authors describe the application of ballistic electron emission microscopy to measure electrical barriers with nm spatial resolution. They show that the interface between Au and chemically treated CdTe is non-uniform and that problems of reproducibility are associated with small patches at the interface where the barriers are low.
5