A. E. Fowell

The Au/CdTe interface: an investigation of electrical barriers by ballistic electron emission microscopy

A. E. Fowell, R. H. Williams, Bernard E. Richardson et al. · Semiconductor Science and Technology · 1990 · 41 citations

Engineering, Microscopy, Electrical Barriers +20

Ballistic electron emission microscopy studies of Au–CdTe and Au–GaAs interfaces and band structure

A. E. Fowell, R. H. Williams, Bernard E. Richardson et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1991 · 33 citations

Engineering, Au–gaas Interfaces, Semiconductor Nanostructures +17

Ballistic electron emission microscopy, current transport, and <i>p</i>-type δ doping control of <i>n</i>-isotype InAs–GaAs heterojunctions

T.-H. Shen, M. Elliott, A. E. Fowell et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1991 · 13 citations

Wide-bandgap Semiconductor, Engineering, Current Transport +16

Probing heterojunctions by ballistic electron emission microscopy

A. E. Fowell, A.A. Cafolla, Bernard E. Richardson et al. · Applied Surface Science · 1992 · 12 citations

Electron Microscopy, Physics, Electron Spectroscopy +3