A Low-Power Single-Clock-Driven Scan Driver Using Depletion-Mode a-IGZO TFTs

Seung‐Jin Yoo, Sungjin Hong, Jin‐Seong Kang, Hai‐Jung In, Oh‐Kyong Kwon

IEEE Electron Device Letters · 2012 · 31 citations · 9 references

Concepts

Abstract

A new low-power scan driver using amorphous In-Ga-Zn-O (a-IGZO) thin-film transistor (TFT) is proposed. The proposed scan driver employs only one-clock signal and connects power supply voltage to the drain node of pull-up TFTs in the output stage to reduce the power consumption. The measured power consumption of the proposed scan driver of ten stages is 265 μW at an output voltage of 20 V and a clock frequency of 46.1 kHz, which is the driving condition of the extended graphics array (1024 × 768) panel. The power consumption is less than 11.9% of the previously reported results.

References

9