In situ and ex situ diagnostics on melting and resolidification dynamics of amorphous and polycrystalline silicon thin films during excimer laser annealing

Measurement of the Velocity of the Crystal-Liquid Interface in Pulsed Laser Annealing of Si

G. J. Galvin, Michael O. Thompson, J. W. Mayer et al. · Physical Review Letters · 1982 · 165 citations

Engineering, Materials Engineering, Materials Science +17

Supercooling and Nucleation of Silicon after Laser Melting

S. R. Stiffler, Michael O. Thompson, P. S. Peercy · Physical Review Letters · 1988 · 163 citations

Natural Sciences, Materials Engineering, Materials Science +17

Single-crystal Si films for thin-film transistor devices

James S. Im, Robert S. Sposili, Mark A. Crowder · Applied Physics Letters · 1997 · 117 citations

Engineering, Materials Engineering, Materials Science +17

Theoretical Analysis of Explosively Propagating Molten Layers in Pulsed-Laser-Irradiated<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi>a</mml:mi><mml:mo>−</mml:mo><mml:mi mathvariant="normal">Si</mml:mi></mml:math>

R. F. Wood, G.A. Geist · Physical Review Letters · 1986 · 72 citations

Natural Sciences, Materials Engineering, Materials Science +17

Explosive crystallization starting from an amorphous-silicon surface region during long pulsed-laser irradiation

Kouichi Murakami, Osamu Eryu, K. Takita et al. · Physical Review Letters · 1987 · 69 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +17