Physical review. B, Condensed matter · 1980 · 10 citations · 13 references
Natural SciencesMaterials EngineeringMaterials ScienceMaterials PhysicsSemiconductor MaterialsSpectroscopyAmorphous MaterialsAmorphous SemiconductorsAmorphous SolidsElectronic Material CharacterizationSemiconductor PhysicsSilicon MaterialsAmorphous Semiconductor FilmsAmorphous SiliconAmorphous Thin FilmsHydrogenated Amorphous SiliconOptical Properties Of Amorphous MaterialsSilicon Optical PropertiesSilicon Thin Films
Electroreflectance (ER) measurements have been performed on a number of sputtered hydrogenated amorphous silicon films in the vicinity of the absorption edge. The results confirm features seen in unmodulated spectra but do not show any new details. The usefulness of ER is assessed, and a model is advanced to explain the occurrence and spectral dependence of the phenomenon in amorphous silicon.
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R. E. Burgess · Journal of the Franklin Institute · 1973 · 1.4K citations
Electroreflectance at a Semiconductor-Electrolyte Interface
M. Cardona, K. L. Shaklee, Fred H. Pollak · Physical Review · 1967 · 779 citations