Concepedia

3D strain measurement in electronic devices using through-focal annular dark-field imaging

Suhyun Kim, Younheum Jung, Sung-Ho Lee, Joong Jung Kim, Gwangseon Byun, Sunyoung Lee, Haebum Lee

Ultramicroscopy · 2014 · 13 citations · 36 references

Concepts

EngineeringMaterials EngineeringMaterials ScienceBiomedical ImagingMechanical Behavior Of MaterialsOptics3D ImagingStrain AnalysisStrain EngineeringStrain MeasurementStrain SensorsStress-strain BehaviorDark-field ImagingHigh-resolution Strain MeasurementMicroscale Strain MeasurementOptical Strain MeasurementStrain SensingStress MeasurementSurface Strain Measurement

References

36

Quantitative measurement of displacement and strain fields from HREM micrographs

Martin Hÿtch, E. Snoeck, R. Kilaas · Ultramicroscopy · 1998 · 2.7K citations

Engineering, Biophysics, Materials Engineering +14

Piezoresistance Effect in Germanium and Silicon

Charles S. Smith · Physical Review · 1954 · 2K citations

Natural Sciences, Materials Science, Physics +10

Band structure, deformation potentials, and carrier mobility in strained Si, Ge, and SiGe alloys

Massimo V. Fischetti, S.E. Laux · Journal of Applied Physics · 1996 · 1.5K citations

Natural Sciences, Materials Science, Physics +17

Uniaxial-process-induced strained-Si: extending the CMOS roadmap

Scott E. Thompson, Guangyu Sun, Youn Sung Choi et al. · IEEE Transactions on Electron Devices · 2006 · 585 citations

Engineering, Electrical Engineering, Materials Science +17

Piezoresistancc effect in germanium and silicon

Charlie Smith · Physical Review D · 1954 · 497 citations

Engineering, Materials Engineering, Materials Science +11