Noise as a diagnostic and prediction tool in reliability physics

Multiplication noise in uniform avalanche diodes

R.J. McIntyre · IEEE Transactions on Electron Devices · 1966 · 1.4K citations

Engineering, Electrical Engineering, Circuit Theory +14

Noise in solid-state microstructures: A new perspective on individual defects, interface states and low-frequency (1/<i>ƒ</i>) noise

M. J. Kirton, Michael J. Uren · Advances In Physics · 1989 · 1.3K citations

Natural Sciences, Materials Science, Physics +17

Hot-electron-induced MOSFET degradation&amp;#8212;Model, monitor, and improvement

Chenming Hu, Simon Tam, Fu-Chieh Hsu et al. · IEEE Transactions on Electron Devices · 1985 · 1.1K citations

Engineering, Electrical Engineering, Physics +17

Experimental studies on 1/f noise

F.N. Hooge, T.G.M. Kleinpenning, L.K.J. Vandamme · Reports on Progress in Physics · 1981 · 1.1K citations

Engineering, Electrical Engineering, Physics +17

1/ƒ noise is no surface effect

F.N. Hooge · Physics Letters A · 1969 · 1.1K citations

Natural Sciences, Geophysics, Acoustics +5