A study of deep levels in GaAs by capacitance spectroscopy

Fast capacitance transient appartus: Application to ZnO and O centers in GaP <i>p-n</i> junctions

D. V. Lang · Journal of Applied Physics · 1974 · 604 citations

Engineering, Materials Engineering, Materials Science +17

Schottky-barrier capacitance measurements for deep level impurity determination

Marcus Bleicher, Eckhard Lange · Solid-State Electronics · 1973 · 92 citations

Engineering, Electrical Engineering, Materials Science +14

Capacitance Measurements on Au–GaAs Schottky Barriers

R. R. Senechal, J. Basinski · Journal of Applied Physics · 1968 · 63 citations

Engineering, Electrical Engineering, Materials Science +17

Determination of deep levels in semiconductors from C-V measurements

Gary H. Glover · IEEE Transactions on Electron Devices · 1972 · 62 citations

Engineering, Materials Science, Physics +16

Deep levels in gallium arsenide by capacitance methods

Kazuo Sakai, Toshiaki Ikoma · Applied Physics A · 1974 · 54 citations

Engineering, Chemistry, Materials Science +14