Journal of Materials Science Letters · 2001 · 29 citations · 4 references
EngineeringElectrical EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsDevice CharacterizationDevice ModelingDevice ReliabilityDevice SimulationSemiconductor Device MaterialsSemiconductor ReliabilityDegradationDevice DegradationNonlinear Device CharacterizationNonlinear Optical PropertiesTransistor NonlinearityVaristor BehaviorVaristor Ceramics
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