Publication | Open Access
Nanotribological, nanomechanical and interfacial characterization of atomic layer deposited TiO2 on a silicon substrate
18
Citations
30
References
2015
Year
Materials ScienceEngineeringNanomaterialsNanotechnologySurface ScienceApplied PhysicsNanometrologySilicon SubstrateAtomic LayerNanotribologyInterfacial Characterization
| Year | Citations | |
|---|---|---|
Page 1
Page 1