Nonvolatile switching characteristics of laser-ablated Ge2Sb2Te5 nanoparticles for phase-change memory applications

Dongseok Suh, Eun Hye Lee, Kijoon H. P. Kim, Jin‐Seo Noh, Woong-Chul Shin, Youn-Seon Kang, Cheolkyu Kim, Yoonho Khang, H. R. Yoon, William Jo

Applied Physics Letters · 2007 · 26 citations · 6 references

Concepts

Abstract

Electrical characteristics of Ge2Sb2Te5 (GST) nanoparticles have been examined for a phase-change memory applications. The GST nanoparticles were generated by in situ pulsed laser ablation and their crystal structure formation was confirmed [H. R. Yoon et al., J. Non-Cryst. Solids 351, 3430 (2005)]. A stacked structure of the GST nanoparticles with 10nm of average diameter shows reversible nonvolatile switching characteristics between a high resistance state and a low resistance state as in the phase-change memory consisting of bulk GST thin film. Experimental results indicate that it is highly probable to test scaling issues of the phase-change memory with well-defined GST nanoparticles.

References

6