Automatic behavioral test pattern generation for digital circuits

Anne-Lise Courbis, Jean-François Santucci, Norbert Giambiasi

2003 · 12 citations · 20 references

Concepts

Abstract

As complexity of circuits has increased and design techniques have evolved, testing them has evolved as well. This evolution has led to take into account high-level behavioral descriptions of circuits for generating their test patterns. The authors explain the reasons which have motivated research laboratory to become interested in behavioral generation. Having surveyed the representative work of the domain, the authors present their approach for generating test patterns from high-level behavioral descriptions.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">&gt;</ETX>

References

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