MPC Computers (United States)

Practical guides for x-ray photoelectron spectroscopy: First steps in planning, conducting, and reporting XPS measurements

Donald R. Baer, Kateryna Artyushkova, C. R. Brundle et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 2019 · 199 citations · Full text

TLP calibration, correlation, standards, and new techniques

Jon Barth, K. Verhaege, L. Henry et al. · IEEE Transactions on Electronics Packaging Manufacturing · 2001 · 189 citations

Engineering, Measurement, Measurement Standards (Educational Assessment) +16

A New Method and Mass Spectrometer Design for TOF-SIMS Parallel Imaging MS/MS

Gregory L. Fisher, Anne L. Bruinen, Nina Ogrinc et al. · Analytical Chemistry · 2016 · 120 citations

High Resolution, Engineering, Microscopy +21

Microcontact Printed BaTiO ₃ and LaNiO ₃ Thin Films for Capacitors

Hajime Nagata, Song Won Ko, Eunki Hong et al. · Journal of the American Ceramic Society · 2006 · 56 citations

Robust BME Class-I MLCCs for Harsh-Environment Applications

Xilin Xu, Abhijit Gurav, Philip Lessner et al. · IEEE Transactions on Industrial Electronics · 2010 · 52 citations

Robust Reliability, Dielectrics, Engineering +19