Thin-film Interface Engineering
Thin-Film Interface Engineering is a materials science discipline that focuses on the deliberate design, manipulation, and optimization of interfacial properties between thin-film layers to control adhesion, diffusion, electronic behavior, and structural integrity in multilayer systems.
1K
Publications
37.1K
Citations
4.3K
Authors
1.1K
Institutions
Publications per year
2017–2026
252
Parents
1K
Biaxial alignment in sputter deposited thin films
Stijn Mahieu, Pieter Ghekiere, Diederik Depla et al. · Thin Solid Films · 2006 · 435 citations · Full text
Natural Sciences, Materials Engineering, Materials Science +10
Microstructure and surface control of MXene films for water purification
Xiuqiang Xie, Chi Chen, Nan Zhang et al. · Nature Sustainability · 2019 · 412 citations
Natural Sciences, Materials Engineering, Materials Science +16
Contact resistance extraction in pentacene thin film transistors
P. V. Necliudov, M. S. Shur, David J. Gundlach et al. · Solid-State Electronics · 2002 · 321 citations
1–5 of 1K
4.3K
7
h-index
5
h-index
5
h-index
4
h-index
4
h-index
1–5 of 4.3K
1.1K

Chinese Academy of Sciences
Beijing, China
23 h-index
191 publications
8.8K citations

Centre National de la Recherche Scientifique
Paris, France
17 h-index
93 publications
2.1K citations
University of Chinese Academy of Sciences
Beijing, China
14 h-index
44 publications
1.5K citations
Nanyang Technological University
Singapore, Singapore
13 h-index
49 publications
4.6K citations
Lanzhou Institute of Chemical Physics
Lanzhou, China
12 h-index
57 publications
2.6K citations
Tsinghua University
Beijing, China
11 h-index
45 publications
1.4K citations

Xi'an Jiaotong University
Xi'an, China
11 h-index
48 publications
1.2K citations
Yonsei University
Seoul, South Korea
11 h-index
37 publications
846 citations
1–8 of 1.1K
126 publications · 5.2K citations
38
h-index
74 publications · 3.2K citations
30
h-index
62 publications · 1.9K citations
26
h-index
33 publications · 1.3K citations
19
h-index
35 publications · 1.1K citations
18
h-index
1–5