A. Zalar

Improved depth resolution by sample rotation during Auger electron spectroscopy depth profiling

A. Zalar · Thin Solid Films · 1985 · 249 citations

Spectroscopy Depth, Sample Rotation, Electron Microscopy +11

Oxidation of TiN, ZrN, TiZrN, CrN, TiCrN and TiN/CrN multilayer hard coatings reactively sputtered at low temperature

P. Panjan, B. Navinšek, A. Cvelbar et al. · Thin Solid Films · 1996 · 182 citations

Materials Science, Materials Engineering, Chemical Engineering +9

XPS study of oxygen plasma activated PET

Alenka Vesel, Miran Mozetič, A. Zalar · Vacuum · 2007 · 122 citations

Electrophysiology, Biomedical Engineering, Nonthermal Plasma +2

Increased surface roughness by oxygen plasma treatment of graphite/polymer composite

Uroš Cvelbar, S. Pejovnik, M. Mozetiè et al. · Applied Surface Science · 2003 · 108 citations

Materials Science, Engineering, Carbon-based Material +6

Depth resolution and surface roughness effects in sputter profiling of NiCr multilayer sandwich samples using Auger electron spectroscopy

S. Hofmann, J. Erlewein, A. Zalar · Thin Solid Films · 1977 · 95 citations

Materials Science, Surface Characterization, Auger Electron Spectroscopy +14