Concepedia

Stylus Profilometry

Stylus Profilometry is a surface measurement technique that employs a physical probe drawn across a material's surface to detect microscopic irregularities, distinguishing itself by directly transducing vertical displacements of the stylus into quantitative roughness data with high vertical resolution.

154

Publications

6.9K

Citations

494

Authors

186

Institutions

Publications per year

2017–2026

25

Parents

Publications

154

Comparison of surface roughness measurements by stylus profiler, AFM and non-contact optical profiler

Chin Y. Poon, Bharat Bhushan · Wear · 1995 · 479 citations

, , +16

Growth of ZnO/Al<sub>2</sub>O<sub>3</sub> Alloy Films Using Atomic Layer Deposition Techniques

Jeffrey W. Elam, Steven M. George · Chemistry of Materials · 2003 · 368 citations

, , +17

Surface Roughness of Nanofill and Nanohybrid Resin Composites after Polishing and Brushing

Pisol Senawongse, Pong Pongprueksa · Journal of Esthetic and Restorative Dentistry · 2007 · 221 citations

, , +17

Comparison of optical and stylus methods for measurement of surface texture

Theodore V. Vorburger, Hyug-Gyo Rhee, Thomas B. Renegar et al. · The International Journal of Advanced Manufacturing Technology · 2007 · 213 citations

, , +11

Advanced laser scanning for highly-efficient ablation and ultrafast surface structuring: experiment and model

Andrius Žemaitis, Mantas Gaidys, Marijus Brikas et al. · Scientific Reports · 2018 · 157 citations · Full text

, , +17

1–5 of 154

Authors

494

  1. TV
    Theodore V. Vorburger

    National Institute of Standards and Technology, United States

    6 publications · 354 citations

    6

    h-index

  2. DC
    D.G. Chetwynd

    University of Warwick, United Kingdom

    4 publications · 81 citations

    4

    h-index

  3. JS
    Junfeng Song

    Jilin University, China

    4 publications · 121 citations

    4

    h-index

  4. DJ
    David J. Whitehouse

    University of Warwick, United Kingdom

    3 publications · 89 citations

    3

    h-index

  5. JH
    J. H. Armstrong

    Lockheed Martin (United States), United States

    2 publications · 81 citations

    2

    h-index

1–5 of 494

Institutions

186

  1. National Institute of Standards and Technology

    Gaithersburg, United States

    6 h-index

    26 publications

    1.9K citations

  2. University of Warwick

    Coventry, United Kingdom

    5 h-index

    12 publications

    240 citations

  3. Physikalisch-Technische Bundesanstalt

    Braunschweig, Germany

    5 h-index

    16 publications

    293 citations

  4. Tianjin University

    Tianjin, China

    3 h-index

    8 publications

    158 citations

  5. Naval Air Warfare Center Weapons Division

    China Lake Acres, United States

    3 h-index

    6 publications

    123 citations

  6. Justus-Liebig-Universität Gießen

    Giessen, Germany

    3 h-index

    4 publications

    349 citations

  7. Tokyo Medical and Dental University

    Tokyo, Japan

    3 h-index

    9 publications

    303 citations

  8. University of Manchester

    Manchester, United Kingdom

    3 h-index

    6 publications

    691 citations

1–8 of 186

Venues

  1. Wear

    9 publications · 736 citations

    9

    h-index

  2. Measurement Science and Technology

    7 publications · 172 citations

    7

    h-index

  3. Precision Engineering

    6 publications · 153 citations

    6

    h-index

  4. Surface Topography Metrology and Properties

    STMP · 5 publications · 105 citations

    5

    h-index

  5. Applied Optics

    5 publications · 222 citations

    5

    h-index

1–5