David J. Whitehouse

The properties of random surfaces of significance in their contact

David J. Whitehouse, J. F. Archard · Proceedings of the Royal Society of London A Mathematical and Physical Sciences · 1970 · 886 citations

Engineering, Manufacturing Engineering, Materials Science +17

Technological shifts in surface metrology

Xiangqian Jiang, David J. Whitehouse · CIRP Annals · 2012 · 274 citations

Engineering, Materials Engineering, Materials Science +14

Some theoretical aspects of error separation techniques in surface metrology

David J. Whitehouse · Journal of Physics E Scientific Instruments · 1976 · 254 citations

Engineering, Materials Engineering, Metrology +15

Paradigm shifts in surface metrology. Part II. The current shift

Xiangqian Jiang, Paul J. Scott, David J. Whitehouse et al. · Proceedings of the Royal Society A Mathematical Physical and Engineering Sciences · 2007 · 237 citations

Engineering, Manufacturing Engineering, Mechanical Engineering +17

Surface metrology

David J. Whitehouse · Measurement Science and Technology · 1997 · 171 citations

Engineering, Materials Science, Instrumentation +16