Scan Chain Debugging

Scan Chain Debugging is a hardware debugging method that enables the observation and control of internal circuit states through a serially connected chain of flip-flops, distinguished by its use of scan-based test architecture to facilitate fault detection and diagnosis in digital integrated circuits.

Publications

695

Citations

Authors

Institutions

Publications per year

2017–2026

Parents

Hardware Debugging

Publications

An efficient scheme to diagnose scan chains

Sridhar Narayanan, Anirban Das · 2002 · 106 citations

Engineering, Computer Engineering, Electrical Engineering +17

High-accuracy flush-and-scan software diagnostic

Karen Stanley · IEEE Design & Test of Computers · 2001 · 88 citations

Computing, Computer Engineering, Computer Science +17

Silicon debug: scan chains alone are not enough

G.J. van Rootselaar, Bart Vermeulen · 2003 · 86 citations

Engineering, Computer Engineering, Electrical Engineering +14

A novel scan chain diagnostics technique based on light emission from leakage current

Peilin Song, Franco Stellari, Tian Xia et al. · 2005 · 57 citations

Engineering, Computer Engineering, Electrical Engineering +17

Latch divergency in microprocessor failure analysis

Peter Dahlgren, Paul Dickinson, Ishwar Parulkar · 2004 · 47 citations

Engineering, Computer Engineering, Computer Science +17

1–5 of 21

Authors

JW
Jing Wang
Capital Normal University, China
2 publications · 29 citations
2
h-index
FS
Franco Stellari
IBM Research - Thomas J. Watson Research Center, United States
2 publications · 72 citations
2
h-index
MM
Michael Mateja
Advanced Micro Devices (United States), United States
2 publications · 29 citations
2
h-index
PS
Peilin Song
IBM Research - Thomas J. Watson Research Center, United States
2 publications · 72 citations
2
h-index
KT
Karen Tomko
Ohio Supercomputer Center, United States
2 publications · 38 citations
2
h-index

1–5 of 62

Institutions

1–8 of 25

Venues

IEEE Design & Test of Computers
2 publications · 99 citations
2
h-index
Proceedings - IEEE VLSI Test Symposium/Proceedings of the ... IEEE VLSI Test Symposium
VTS · 1 publications · 13 citations
1
h-index
Proceedings of the ASP-DAC Asia and South Pacific Design Automation Conference, 2003.
Conference · 1 publications · 11 citations
1
h-index
Proceedings - International Symposium for Testing and Failure Analysis
1 publications · 15 citations
1
h-index
Proceedings Design, Automation and Test in Europe Conference and Exhibition
Conference · 1 publications · 16 citations
1
h-index

1–5