Phase Shift Masks

Phase Shift Masks is a photolithographic masking technique in semiconductor manufacturing that enhances image resolution by exploiting constructive and destructive interference of light waves through precisely engineered phase-modulating regions on the mask, thereby distinguishing it from conventional binary intensity masks.

281

Publications

9.1K

Citations

920

Authors

215

Institutions

Publications per year

2017–2026

24

Variants

Phase-shift Masks

Authors

920

  1. AE
    Andreas Erdmann

    Fraunhofer Institute for Integrated Systems and Device Technology, Germany

    11 publications · 257 citations

    11

    h-index

  2. AB
    Andrew B. Kahng

    University of California San Diego, United States

    8 publications · 167 citations

    8

    h-index

  3. AR
    Andrew R. Neureuther

    University of California, Berkeley, United States

    8 publications · 250 citations

    8

    h-index

  4. MM
    Martin McCallum

    Nikon (United Kingdom), United Kingdom

    8 publications · 108 citations

    8

    h-index

  5. JS
    John S. Petersen

    IMEC, Belgium

    7 publications · 91 citations

    7

    h-index

1–5 of 920

Venues

  1. 23

    h-index

  2. Japanese Journal of Applied Physics

    JJAP · 20 publications · 469 citations

    13

    h-index

  3. Optics Communications

    13 publications · 642 citations

    13

    h-index

  4. 13

    h-index

  5. Optics Express

    10 publications · 490 citations

    10

    h-index

1–5