Network-on-chip Testability

Network-On-Chip Testability is a design-for-testability methodology that enables the systematic verification and fault detection of interconnection networks within multi-core integrated circuits by incorporating dedicated test structures and protocols to ensure reliable communication fabric operation.

Publications

2.3K

Citations

154

Authors

Institutions

Publications per year

2017–2026

Parents

Design For Testability

Publications

Design, Synthesis, and Test of Networks on Chips

Partha Pratim Pande, Cristian Grecu, A. Ivanov et al. · IEEE Design & Test of Computers · 2005 · 175 citations · Full text

Engineering, Computer Engineering, Electrical Engineering +17

Bringing communication networks on a chip: test and verification implications

Bart Vermeulen, J. Dielissen, Kees Goossens et al. · IEEE Communications Magazine · 2003 · 124 citations

Engineering, Computer Engineering, Electrical Engineering +16

Techniques for Concurrent Testing of VLSI Processor Operation.

Masood Namjoo · International Test Conference · 1982 · 107 citations

Engineering, Computer Engineering, Computer Science +12

A scalable test strategy for network-on-chip routers

Alexandre M. Amory, Eduardo Brião, Érika Cota et al. · 2006 · 103 citations

Engineering, Computer Engineering, Computer Systems +17

BIST for Network-on-Chip Interconnect Infrastructures

Cristian Grecu, Partha Pratim Pande, A. Ivanov et al. · 2006 · 90 citations

Engineering, Computer Engineering, Computer Science +17

1–5 of 76

Authors

154

ÉC
Érika Cota
Universidade Federal do Rio Grande do Sul, Brazil
9 publications · 449 citations
9
h-index
AI
A. Ivanov
University of British Columbia, Canada
7 publications · 508 citations
7
h-index
BB
Biswajit Bhowmik
National Institute of Technology Karnataka, India
7 publications · 105 citations
7
h-index
SB
Santosh Biswas
Indian Institute of Technology Guwahati, India
7 publications · 105 citations
7
h-index
ML
Marcelo Lubaszewski
Universidade Federal do Rio Grande do Sul, Brazil
7 publications · 311 citations
7
h-index

1–5 of 154

Institutions

1–8 of 72

Venues

Journal of Electronic Testing
JETTA · 4 publications · 67 citations
4
h-index
ACM Transactions on Design Automation of Electronic Systems
TODAES · 3 publications · 44 citations
3
h-index
IEEE Design & Test of Computers
2 publications · 192 citations
2
h-index
Design, Automation, and Test in Europe
Conference · 2 publications · 49 citations
2
h-index
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
2 publications · 105 citations
2
h-index

1–5