Narrow Width Effects

Narrow Width Effects is a short-channel effect in semiconductor device physics wherein the threshold voltage of a MOSFET increases due to the lateral confinement of the channel region, leading to enhanced carrier confinement and reduced current drive in narrow-width transistors.

125

Publications

5.7K

Citations

469

Authors

182

Institutions

Publications per year

2017–2026

21

Variants

Narrow-width Effects

Authors

469

  1. LA
    L.A. Akers

    Arizona State University, United States

    4 publications · 200 citations

    4

    h-index

  2. CY
    C.–P. Yuan

    Michigan State University, United States

    4 publications · 327 citations

    4

    h-index

  3. RS
    R. Schwienhorst

    Michigan State University, United States

    3 publications · 226 citations

    3

    h-index

  4. SJ
    Senthil Jayapal

    Imec the Netherlands, Netherlands

    3 publications · 90 citations

    3

    h-index

  5. AC
    Amitava Chatterjee

    Jadavpur University, India

    3 publications · 73 citations

    3

    h-index

1–5 of 469

Venues

  1. IEEE Transactions on Electron Devices

    15 publications · 521 citations

    14

    h-index

  2. IEEE Electron Device Letters

    7 publications · 185 citations

    7

    h-index

  3. Journal of High Energy Physics

    JHEP · 5 publications · 170 citations

    5

    h-index

  4. Electronics Letters

    4 publications · 156 citations

    4

    h-index

  5. Solid-State Electronics

    4 publications · 72 citations

    4

    h-index

1–5