Intra-device Variability

Intra-Device Variability is the inherent variation in physical or electrical characteristics of a single Physical Unclonable Function instance across repeated measurements or environmental conditions, reflecting measurement-specific fluctuations distinct from inter-device differences.

52

Publications

2.7K

Citations

249

Authors

114

Institutions

Publications per year

2017–2026

25

Authors

249

  1. DS
    D. Schmitt‐Landsiedel

    Technical University of Munich, Germany

    3 publications · 208 citations

    3

    h-index

  2. MK
    Moinuddin K. Qureshi

    Georgia Institute of Technology, United States

    2 publications · 348 citations

    2

    h-index

  3. ML
    Manuel Le Gallo

    IBM Research - Zurich, Switzerland

    2 publications · 209 citations

    2

    h-index

  4. RA
    Robert Aitken

    American Rock Mechanics Association, United States

    2 publications · 39 citations

    2

    h-index

  5. SP
    Sebastián Pazos

    King Abdullah University of Science and Technology, Saudi Arabia

    2 publications · 107 citations

    2

    h-index

1–5 of 249

Venues

  1. IEEE Transactions on Electron Devices

    3 publications · 94 citations

    3

    h-index

  2. Scientific Reports

    3 publications · 155 citations

    3

    h-index

  3. PLoS ONE

    3 publications · 81 citations

    3

    h-index

  4. IEEE Magnetics Letters

    2 publications · 28 citations

    2

    h-index

  5. Medicine & Science in Sports & Exercise

    MSSE · 2 publications · 253 citations

    2

    h-index

1–5