Concepedia

Input Protection

Input Protection is a circuit-level design strategy within instrumentation amplifier systems that limits excessive voltage or current at the input terminals to prevent damage or performance degradation, distinguishing itself from other protection methods by specifically safeguarding sensitive measurement components against transient events and overdrive conditions.

30

Publications

746

Citations

109

Authors

35

Institutions

Publications per year

2017–2026

2

Parents

Publications

30

A Fully Integrated 16-Channel Closed-Loop Neural-Prosthetic CMOS SoC With Wireless Power and Bidirectional Data Telemetry for Real-Time Efficient Human Epileptic Seizure Control

Cheng-Hsiang Cheng, Ping-Yuan Tsai, Tzu-Yi Yang et al. · IEEE Journal of Solid-State Circuits · 2018 · 137 citations

, , +17

A synthesis of ESD input protection scheme

Charvaka Duvvury, R.N. Rountree · Journal of Electrostatics · 1992 · 66 citations

, , +5

ESD protection for submicron CMOS circuits-issues and solutions

R.N. Rountree · 2003 · 50 citations

, , +14

Cancellation technique to provide ESD protection for multi-GHz RF inputs

Sami Hyvonen, S. Joshi, Elyse Rosenbaum · Electronics Letters · 2003 · 38 citations

, , +6

Thermal response of integrated circuit input devices to an electrostatic energy pulse

G. Krieger · IEEE Transactions on Electron Devices · 1987 · 38 citations

, , +16

1–5 of 30

Authors

109

  1. TH
    T. Hiraoka

    Hitachi (Japan), Japan

    2 publications · 21 citations

    2

    h-index

  2. SH
    Sami Hyvonen

    University of Illinois Urbana-Champaign, United States

    2 publications · 53 citations

    2

    h-index

  3. CW
    Chung‐Yu Wu

    National Yang Ming Chiao Tung University, Taiwan

    2 publications · 167 citations

    2

    h-index

  4. AA
    A. Andreini

    STMicroelectronics (Italy), Italy

    2 publications · 24 citations

    2

    h-index

  5. WW
    W. Wilkening

    Robert Bosch (Germany), Germany

    2 publications · 24 citations

    2

    h-index

1–5 of 109

Institutions

35

  1. National Yang Ming Chiao Tung University

    Hsinchu, Taiwan

    3 h-index

    19 publications

    2K citations

  2. STMicroelectronics (Italy)

    Milan, Italy

    2 h-index

    8 publications

    96 citations

  3. University of California, Berkeley

    Berkeley, United States

    2 h-index

    4 publications

    64 citations

  4. Fraunhofer Institute for Reliability and Microintegration

    Berlin, Germany

    2 h-index

    4 publications

    48 citations

  5. Texas Instruments (United States)

    Dallas, United States

    2 h-index

    3 publications

    182 citations

  6. University of Illinois Urbana-Champaign

    Urbana, United States

    2 h-index

    6 publications

    159 citations

  7. Robert Bosch (Germany)

    Stuttgart, Germany

    2 h-index

    10 publications

    120 citations

  8. Fraunhofer-Gesellschaft

    Munich, Germany

    2 h-index

    4 publications

    48 citations

1–8 of 35

Venues

  1. Reliability physics

    3 publications · 53 citations

    3

    h-index

  2. Microelectronics Reliability

    2 publications · 29 citations

    2

    h-index

  3. Electrical Overstress/Electrostatic Discharge Symposium

    Conference · 2 publications · 26 citations

    2

    h-index

  4. IEEE Transactions on Electron Devices

    2 publications · 54 citations

    2

    h-index

  5. IEEE Journal of Solid-State Circuits

    2 publications · 149 citations

    2

    h-index

1–5