Forward Body Biasing
Forward Body Biasing is a dynamic voltage scaling technique in semiconductor device physics where a small positive voltage is applied to the body terminal of a MOSFET relative to its source to reduce the threshold voltage, thereby enhancing circuit performance while managing leakage power.
121
Publications
3.8K
Citations
520
Authors
147
Institutions
Publications per year
2017–2026
24
Variants
Forward Body Bias
Parents
121
1–5 of 121
520
5
h-index
5
h-index
5
h-index
5
h-index
4
h-index
1–5 of 520
147
Intel (United States)
Santa Clara, United States
8 h-index
50 publications
5.1K citations
STMicroelectronics (France)
Montrouge, France
5 h-index
14 publications
284 citations
Purdue University West Lafayette
West Lafayette, United States
4 h-index
13 publications
538 citations

National Yang Ming Chiao Tung University
Hsinchu, Taiwan
4 h-index
9 publications
198 citations

National Taiwan University
Taipei, Taiwan
4 h-index
15 publications
404 citations
University of California, Berkeley
Berkeley, United States
4 h-index
18 publications
550 citations
Texas Instruments (United States)
Dallas, United States
3 h-index
7 publications
148 citations

Amrita Vishwa Vidyapeetham
Coimbatore, India
3 h-index
8 publications
174 citations
1–8 of 147
7 publications · 449 citations
7
h-index
6 publications · 264 citations
6
h-index
4 publications · 159 citations
4
h-index
4 publications · 58 citations
4
h-index
4 publications · 609 citations
4
h-index
1–5