Forward Body Biasing

Forward Body Biasing is a dynamic voltage scaling technique in semiconductor device physics where a small positive voltage is applied to the body terminal of a MOSFET relative to its source to reduce the threshold voltage, thereby enhancing circuit performance while managing leakage power.

121

Publications

3.8K

Citations

520

Authors

147

Institutions

Publications per year

2017–2026

24

Variants

Forward Body Bias

Authors

520

  1. SN
    S. Narendra

    Intel (United States), United States

    5 publications · 569 citations

    5

    h-index

  2. VD
    Vivek De

    Intel (United States), United States

    5 publications · 525 citations

    5

    h-index

  3. BB
    B. Bloechel

    Intel (United States), United States

    5 publications · 569 citations

    5

    h-index

  4. SB
    Shekhar Borkar

    Intel (United States), United States

    5 publications · 569 citations

    5

    h-index

  5. KR
    Kaushik Roy

    Purdue University West Lafayette, United States

    4 publications · 185 citations

    4

    h-index

1–5 of 520

Venues

  1. 7

    h-index

  2. IEEE Microwave and Wireless Components Letters

    6 publications · 264 citations

    6

    h-index

  3. IEEE Transactions on Electron Devices

    4 publications · 159 citations

    4

    h-index

  4. Solid-State Electronics

    4 publications · 58 citations

    4

    h-index

  5. IEEE Journal of Solid-State Circuits

    4 publications · 609 citations

    4

    h-index

1–5