Double Patterning Layout

Double Patterning Layout is a photolithographic decomposition method in Very-Large-Scale Integration (VLSI) physical design that partitions a single metal or via layer into two separate mask layouts to overcome optical resolution limits by ensuring feature pitch compliance with manufacturing constraints.

113

Publications

4K

Citations

389

Authors

73

Institutions

Publications per year

2017–2026

6

Authors

389

  1. DZ
    David Z. Pan

    The University of Texas at Austin, United States

    21 publications · 985 citations

    17

    h-index

  2. MD
    Martin D. F. Wong

    University of Illinois Urbana-Champaign, United States

    10 publications · 314 citations

    10

    h-index

  3. KY
    Kun Yuan

    The University of Texas at Austin, United States

    8 publications · 459 citations

    8

    h-index

  4. AB
    Andrew B. Kahng

    University of California San Diego, United States

    8 publications · 324 citations

    8

    h-index

  5. YD
    Yuelin Du

    University of Illinois Urbana-Champaign, United States

    7 publications · 150 citations

    7

    h-index

1–5 of 389

Venues

  1. 17

    h-index

  2. 10

    h-index

  3. 4

    h-index

  4. International Conference on Computer Aided Design

    Conference · 4 publications · 82 citations

    4

    h-index

  5. Microelectronic Engineering

    2 publications · 37 citations

    2

    h-index

1–5