Double Patterning Layout
Double Patterning Layout is a photolithographic decomposition method in Very-Large-Scale Integration (VLSI) physical design that partitions a single metal or via layer into two separate mask layouts to overcome optical resolution limits by ensuring feature pitch compliance with manufacturing constraints.
113
Publications
4K
Citations
389
Authors
73
Institutions
Publications per year
2017–2026
6
113
S. Natarajan, M. Agostinelli, Sheikh A. Akbar et al. · 2014 · 532 citations
Engineering, Computer Engineering, Electrical Engineering +16
Double patterning design split implementation and validation for the 32nm node
Martin Drapeau, Vincent Wiaux, Eric Hendrickx et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2007 · 95 citations
Engineering, Computer Engineering, Computer-aided Design +13
Layout decomposition for triple patterning lithography
Bei Yu, Kun Yuan, Boyang Zhang et al. · 2011 · 92 citations · Full text
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389
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University of Illinois Urbana-Champaign, United States
10 publications · 314 citations
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8
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8
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7
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1–5 of 389
73
The University of Texas at Austin
Austin, United States
16 h-index
57 publications
2.6K citations

GlobalFoundries (United States)
Santa Clara, United States
10 h-index
27 publications
557 citations
University of Illinois Urbana-Champaign
Urbana, United States
10 h-index
32 publications
977 citations
IMEC
Leuven, Belgium
9 h-index
45 publications
1.4K citations
IBM (United States)
Armonk, United States
9 h-index
13 publications
445 citations
Cadence Design Systems (United States)
San Jose, United States
9 h-index
16 publications
318 citations
University of California San Diego
San Diego, United States
8 h-index
18 publications
653 citations
ASML (Netherlands)
Veldhoven, The Netherlands
7 h-index
25 publications
1.2K citations
1–8 of 73
39 publications · 949 citations
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10 publications · 532 citations
10
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4 publications · 63 citations
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Conference · 4 publications · 82 citations
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2 publications · 37 citations
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