Contact Degradation

Contact Degradation is a phenomenon in metal-semiconductor contacts characterized by the progressive deterioration of electrical performance due to interfacial reactions, diffusion, or defect formation under operational stresses.

602

Publications

18.5K

Citations

2.1K

Authors

570

Institutions

Publications per year

2017–2026

83

Authors

2.1K

  1. RM
    R.D. Malucci

    Auburn University, United States

    18 publications · 564 citations

    13

    h-index

  2. SE
    Suzanne E. Mohney

    Pennsylvania State University, United States

    8 publications · 264 citations

    8

    h-index

  3. GT
    George T. Flowers

    Auburn University, United States

    8 publications · 262 citations

    8

    h-index

  4. JM
    J.W. McBride

    University of Southampton, United Kingdom

    8 publications · 154 citations

    8

    h-index

  5. SJ
    S. J. Pearton

    University of Florida, United States

    8 publications · 202 citations

    8

    h-index

1–5 of 2.1K

Venues

  1. Journal of Applied Physics

    57 publications · 1.7K citations

    25

    h-index

  2. Applied Physics Letters

    35 publications · 1.5K citations

    22

    h-index

  3. 16

    h-index

  4. Wear

    18 publications · 738 citations

    14

    h-index

  5. Microelectronics Reliability

    16 publications · 378 citations

    13

    h-index

1–5