Beam Sensitivity
Beam Sensitivity is a material property that characterizes the susceptibility of a specimen to structural or chemical alteration under electron beam irradiation in Transmission Electron Microscopy, distinguished by its dependence on the beam energy, dose rate, and exposure duration.
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Nicolas Treps, Nicolai B. Grosse, Warwick P. Bowen et al. · Science · 2003 · 318 citations
Natural Sciences, Physics, Optics +12
Self-assembled monolayer electron beam resist on GaAs
R. C. Tiberio, H. G. Craighead, Michael J. Lercel et al. · Applied Physics Letters · 1993 · 134 citations
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Commissariat à l'Énergie Atomique et aux Énergies Alternatives
Paris, France
4 h-index
22 publications
759 citations
Massachusetts Institute of Technology
Cambridge, United States
3 h-index
10 publications
386 citations
IBM (United States)
Armonk, United States
3 h-index
13 publications
409 citations
University of Maryland, College Park
College Park, United States
3 h-index
5 publications
164 citations
Laboratoire d'Électronique des Technologies de l'Information
Grenoble, France
2 h-index
7 publications
164 citations
Eindhoven University of Technology
Eindhoven, The Netherlands
2 h-index
6 publications
90 citations

SINTEF
Trondheim, Norway
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3 publications
41 citations
National University of Singapore
Singapore, Singapore
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2 publications
56 citations
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