Beam Sensitivity

Beam Sensitivity is a material property that characterizes the susceptibility of a specimen to structural or chemical alteration under electron beam irradiation in Transmission Electron Microscopy, distinguished by its dependence on the beam energy, dose rate, and exposure duration.

83

Publications

3.6K

Citations

505

Authors

212

Institutions

Publications per year

2017–2026

12

Authors

505

  1. HF
    Heiner Friedrich

    Eindhoven University of Technology, Netherlands

    2 publications · 30 citations

    2

    h-index

  2. EG
    Edward Gipstein

    IBM (United States), United States

    2 publications · 50 citations

    2

    h-index

  3. AC
    A. C. Ouano

    IBM (United States), United States

    2 publications · 50 citations

    2

    h-index

  4. GD
    Gijsbertus de With

    Eindhoven University of Technology, Netherlands

    2 publications · 30 citations

    2

    h-index

  5. LA
    Lester A. Pederson

    IBM (United States), United States

    2 publications · 54 citations

    2

    h-index

1–5 of 505

Venues

  1. Medical Physics

    5 publications · 178 citations

    5

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  2. 5

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  3. Journal of Vacuum Science and Technology

    4 publications · 138 citations

    4

    h-index

  4. Ultramicroscopy

    4 publications · 353 citations

    4

    h-index

  5. Applied Physics Letters

    3 publications · 189 citations

    3

    h-index

1–5