Active Device Characterization
Active Device Characterization is the systematic determination and modeling of the scattering parameters of active electronic components, such as transistors or amplifiers, under controlled operating conditions to quantify their linear and nonlinear radio-frequency behavior in terms of gain, stability, impedance, and intermodulation performance.
282
Publications
11.7K
Citations
1.1K
Authors
332
Institutions
Publications per year
2017–2026
48
Parents
282
Chris Yakopcic, Tarek M. Taha, Guru Subramanyam et al. · IEEE Electron Device Letters · 2011 · 456 citations
Engineering, Computer Engineering, Electrical Engineering +17
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332
Cardiff University
Cardiff, United Kingdom
16 h-index
92 publications
2K citations

Centre National de la Recherche Scientifique
Paris, France
9 h-index
47 publications
844 citations
Institut d'électronique de microélectronique et de nanotechnologie
Villeneuve-d'Ascq, France
8 h-index
26 publications
577 citations
Politecnico di Torino
Turin, Italy
7 h-index
18 publications
940 citations
KU Leuven
Leuven, Belgium
7 h-index
24 publications
331 citations
STMicroelectronics (France)
Montrouge, France
6 h-index
18 publications
523 citations
University of Ferrara
Ferrara, Italy
6 h-index
18 publications
275 citations

Cornell University
Ithaca, United States
6 h-index
18 publications
549 citations
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24 publications · 953 citations
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15 publications · 1K citations
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13 publications · 717 citations
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11 publications · 225 citations
10
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7 publications · 231 citations
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