Active Device Characterization

Active Device Characterization is the systematic determination and modeling of the scattering parameters of active electronic components, such as transistors or amplifiers, under controlled operating conditions to quantify their linear and nonlinear radio-frequency behavior in terms of gain, stability, impedance, and intermodulation performance.

282

Publications

11.7K

Citations

1.1K

Authors

332

Institutions

Publications per year

2017–2026

48

Authors

1.1K

  1. PT
    P.J. Tasker

    Cardiff University, United Kingdom

    20 publications · 450 citations

    14

    h-index

  2. JB
    J. Benedikt

    Cardiff University, United Kingdom

    15 publications · 283 citations

    12

    h-index

  3. JL
    J. Lees

    Cardiff University, United Kingdom

    10 publications · 211 citations

    10

    h-index

  4. TW
    T. Williams

    Cardiff University, United Kingdom

    6 publications · 102 citations

    6

    h-index

  5. GV
    G. Vannini

    University of Ferrara, Italy

    6 publications · 91 citations

    6

    h-index

1–5 of 1.1K

Venues

  1. 20

    h-index

  2. Applied Physics Letters

    15 publications · 1K citations

    14

    h-index

  3. IEEE Transactions on Electron Devices

    13 publications · 717 citations

    12

    h-index

  4. IEEE Microwave and Wireless Components Letters

    11 publications · 225 citations

    10

    h-index

  5. 7

    h-index

1–5