Christopher S. Litteken

Adhesion of polymer thin-films and patterned lines

Christopher S. Litteken, Reinhold H. Dauskardt · International Journal of Fracture · 2003 · 56 citations

Materials Science, Engineering, Flexible Electronics +6

A 45nm low power system-on-chip technology with dual gate (logic and I/O) high-k/metal gate strained silicon transistors

C.-H. Jan, Peng Bai, S. Biswas et al. · 2008 · 45 citations

Robust Reliability, Engineering, Vlsi Design +17

Comparison of the telephone cord delamination method for measuring interfacial adhesion with the four-point bending method

Alan Lee, Christopher S. Litteken, Reinhold H. Dauskardt et al. · Acta Materialia · 2004 · 40 citations

Engineering, Mechanics, Contact Mechanic +5

Residual stress effects on plastic deformation and interfacial fracture in thin-film structures

Christopher S. Litteken, Sven Strohband, Reinhold H. Dauskardt · Acta Materialia · 2005 · 33 citations

Materials Science, Engineering, Strain Localization +13

Low-K Interconnect Stack with Thick Metal 9 Redistribution Layer and Cu Die Bump for 45nm High Volume Manufacturing

D. Ingerly, Sairam Agraharam, D. Becher et al. · 2008 · 19 citations

Engineering, Vlsi Design, Computer Architecture +23