Richard Beaupre

Time-Dependent Dielectric Breakdown of 4H-SiC MOS Capacitors and DMOSFETs

Kevin Matocha, Greg Dunne, Stanislav I. Soloviev et al. · IEEE Transactions on Electron Devices · 2008 · 79 citations

Reliability, Electrical Engineering, Reliability Engineering +13

Time-Dependent Dielectric Breakdown of 4H-SiC/$ \hbox{SiO}_{2}$ MOS Capacitors

Moshe Gurfinkel, Justin C. Horst, John S. Suehle et al. · IEEE Transactions on Device and Materials Reliability · 2008 · 68 citations

Electrical Engineering, Engineering, High Voltage Engineering +9

Integral micro-channel liquid cooling for power electronics

Ljubisa Stevanovic, Richard Beaupre, Arun Gowda et al. · 2010 · 56 citations

Engineering, Liquid Metal Cooling, Energy Efficiency +18

Microwave power SiC MESFETs and GaN HEMTs

A.P. Zhang, L.B. Rowland, E.B. Kaminsky et al. · Solid-State Electronics · 2003 · 49 citations

Electrical Engineering, Gan Hemts, Engineering +5

Low inductance power module with blade connector

Ljubisa Stevanovic, Richard Beaupre, Eladio Delgado et al. · 2010 · 43 citations

Low-power Electronics, Electrical Engineering, Engineering +13