Stanislav I. Soloviev

Impact Ionization Coefficients in 4H-SiC

W.S. Loh, Beng Koon Ng, Jo Shien Ng et al. · IEEE Transactions on Electron Devices · 2008 · 85 citations

Electrical Engineering, 325-Nm Excitation, Engineering +12

Time-Dependent Dielectric Breakdown of 4H-SiC MOS Capacitors and DMOSFETs

Kevin Matocha, Greg Dunne, Stanislav I. Soloviev et al. · IEEE Transactions on Electron Devices · 2008 · 79 citations

Reliability, Electrical Engineering, Reliability Engineering +13

Deep UV photon-counting detectors and applications

Gary A. Shaw, Andrew M. Siegel, Joshua Model et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2009 · 65 citations · Full text

Photonics, Electrical Engineering, Ultraviolet Light +10

Electrical characterization of 4H–SiC avalanche photodiodes containing threading edge and screw dislocations

R. A. Berechman, Marek Skowroński, Stanislav I. Soloviev et al. · Journal of Applied Physics · 2010 · 55 citations

Semiconductor Technology, Electrical Engineering, Solid-state Lighting +11

Solar-Blind 4H-SiC Single-Photon Avalanche Diode Operating in Geiger Mode

Alexey Vert, Stanislav I. Soloviev, Jody Fronheiser et al. · IEEE Photonics Technology Letters · 2008 · 47 citations

Short Wavelength Optic, Optical Materials, Engineering +20