Concepedia
Statistics
Publications
66
Citations
2.2K
H-Index
23
Active since
1967
Affiliations
University of North Texas(Current)
Texas State University
National Institute of Standards and Technology
Texas Instruments (United States)
Purdue University West Lafayette
David G. Seiler is an author at University of North Texas specializing in natural sciences, materials science, and physics.
Publications per year
1967–2017
Characterization and metrology for ULSI technology
David G. Seiler · Characterization and Metrology for ULSI Technology · 2006 · 350 citations
Engineering, Materials Engineering, Materials Science +12
Semiconductor Characterization: Present Status and Future Needs
W Murray Bullis, David G. Seiler, Alain C. Diebold · 1996 · 87 citations
Engineering, Materials Engineering, Materials Science +16
Characterization of two-dimensional dopant profiles: Status and review
Alain C. Diebold, M.R. Kump, Joseph J. Kopanski et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1996 · 84 citations
Engineering, Electrical Engineering, Materials Science +17
Temperature dependence of the energy gap of InSb using nonlinear optical techniques
C. L. Littler, David G. Seiler · Applied Physics Letters · 1985 · 82 citations
Natural Sciences, Materials Science, Physics +17
Multicarrier characterization method for extracting mobilities and carrier densities of semiconductors from variable magnetic field measurements
J. S. Kim, David G. Seiler, W. F. Tseng · Journal of Applied Physics · 1993 · 79 citations
Natural Sciences, Electrical Engineering, Materials Science +17
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