33
Publications
2.9K
Citations
23
H-Index
1972
Active since
L. C. Feldman is an author at Rutgers, The State University of New Jersey specializing in applied physics, engineering, and materials science.
Top concepts
EngineeringApplied PhysicsPhysicsMaterial ScienceSurface ScienceCondensed Matter PhysicsAtomic PhysicsNatural SciencesThin FilmsChemistry
Publications per year
1972–2014
33
33
D. J. Eaglesham, Alice E. White, L. C. Feldman et al. · Physical Review Letters · 1993 · 494 citations
SiO 2 film thickness metrology by x-ray photoelectron spectroscopy
Zhaoming Lu, J. P. McCaffrey, B. Brar et al. · Applied Physics Letters · 1997 · 225 citations
Materials Science, Semiconductors, Electrical Engineering +13
Ion-beam-induced hydrogen release from <i>a</i>-C:H: A bulk molecular recombination model
M. Adel, Oded Amir, R. Kalish et al. · Journal of Applied Physics · 1989 · 151 citations
Thin film processing and characterization of high-temperature superconductors
J. M. E. Harper, Richard J. Colton, L. C. Feldman · OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information) · 1988 · 144 citations
Materials Science, Superconducting Material, High-tc Superconductivity +10
Rows per page
1–5 of 33