J. C. Bean - Concepedia

Author

J. C. Bean

AT&T (United States)ORCID

Also Known As

Bean, J. C., J C Bean, J. Bean, J. C. BEAN, J. C. Bean, J.C Bean, J.C. BEAN, J.C. Bean, John Bean, John C. Bean

275

Publications

10.4K

Citations

H-Index

173

Concepts

All Affiliations

AT&T (United States)University of Virginia Nokia (United States)Rice University Seattle University

About

J. C. Bean is an author at AT&T (United States) specializing in applied physics, engineering, and materials science.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	42	95	7K
2	Education	8	8	302
3	Natural Sciences	6	6	248
4	Business	2	2	38
5	Language Studies	2	2	88

J. C. Bean

114

Publications

7.8K

Citations

H-Index

Page 1

	Year	Citations
Ge<i>x</i>Si1−<i>x</i>/Si strained-layer superlattice grown by molecular beam epitaxy J. C. Bean, L. C. Feldman, A. T. Fiory, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films SemiconductorsMaterials EngineeringMaterials ScienceOxide HeterostructuresEngineering	1984	676
Raman scattering from Ge<i>x</i>Si1−<i>x</i>/Si strained-layer superlattices F. Cerdeira, A. Pinczuk, J. C. Bean, Applied Physics Letters SemiconductorsMaterials ScienceMaterials EngineeringEngineeringSevere Plastic Deformation	1984	263
Observation of Order-Disorder Transitions in Strained-Semiconductor Systems A. Ourmazd, J. C. Bean Physical Review Letters SemiconductorsMaterials ScienceEngineeringPhysicsCrystalline Defects	1985	261
Stress-induced self-organization of nanoscale structures in SiGe/Si multilayer films Christian Teichert, M. G. Lagally, L. J. Peticolas, Physical review. B, Condensed matter EngineeringCrystal Growth TechnologySilicon On InsulatorLayer ThicknessStress-induced Self-organization	1996	237
Picosecond optoelectronic detection, sampling, and correlation measurements in amorphous semiconductors D. H. Auston, Anthony Johnson, P. R. Smith, Applied Physics Letters High-defect-density Amorphous SemiconductorsEngineeringSemiconductor MaterialsOptoelectronic DevicesSemiconductor Device	1980	223
Epitaxial silicides R. T. Tung, J. M. Poate, J. C. Bean, Thin Solid Films	1982	215
Misfit dislocations in lattice-mismatched epitaxial films R. Hull, J. C. Bean Critical reviews in solid state and materials sciences/CRC critical reviews in solid state and materials sciences SemiconductorsMaterials ScienceEngineeringMisfit DislocationsPhysics	1992	214
Silicon-based semiconductor heterostructures: column IV bandgap engineering J. C. Bean Proceedings of the IEEE SemiconductorsPhotonicsElectrical EngineeringSuperlattice Avalanche PhotodiodesEngineering	1992	207
Growth of single-crystal CoSi2 on Si(111) R. T. Tung, J. C. Bean, J. M. Gibson, Applied Physics Letters SemiconductorsMaterials ScienceEpitaxial GrowthEngineeringCrystalline Defects	1982	201
Ge<i>x</i>Si1−<i>x</i> strained-layer superlattice waveguide photodetectors operating near 1.3 μm H. Temkin, T. P. Pearsall, J. C. Bean, Applied Physics Letters SemiconductorsPhotonicsElectrical EngineeringSuperlattice DetectorsEngineering	1986	197

Page 1