Kiwamu Sakuma

Re-Examination of Vth Window and Reliability in HfO2 FeFET Based on the Direct Extraction of Spontaneous Polarization and Trap Charge during Memory Operation

Reika Ichihara, Kunifumi Suzuki, Haruka Kusai et al. · 2020 · 72 citations

Memory Operation, Electrical Engineering, Vth Window +12

Investigation of Nitrogen-Originated NBTI Mechanism in SiON with High-Nitrogen Concentration

Kiwamu Sakuma, Daisuke Matsushita, Kouichi Muraoka et al. · 2006 · 45 citations

Materials Engineering, Materials Science, Nitrogen Concentration +15

HfO₂-based FeFET and FTJ for Ferroelectric-Memory Centric 3D LSI towards Low-Power and High-Density Storage and AI Applications

Masumi Saitoh, Reika Ichihara, M. Yamaguchi et al. · 2020 · 31 citations

Ai Applications, Engineering, Emerging Memory Technology +20

Carrier transport analysis of high-performance poly-Si Nanowire transistor fabricated by advanced SPC with record-high electron mobility

Minoru Oda, Kiwamu Sakuma, Yuuichi Kamimuta et al. · 2015 · 18 citations

Engineering, Charge Transport, Semiconductor Device +19

High-Endurance FeFET with Metal-Doped Interfacial Layer for Controlled Charge Trapping and Stabilized Polarization

Kunifumi Suzuki, Kiwamu Sakuma, Yoko Yoshimura et al. · 2023 · 14 citations