Norman Robson

Field Tolerant Dynamic Intrinsic Chip ID Using 32 nm High-K/Metal Gate SOI Embedded DRAM

Sami Rosenblatt, Daniel Fainstein, Alberto Cestero et al. · IEEE Journal of Solid-State Circuits · 2013 · 50 citations

Engineering, Computer Engineering, Electrical Engineering +12

An 800-MHz embedded DRAM with a concurrent refresh mode

T. Kirihata, P. Parries, David R. Hanson et al. · IEEE Journal of Solid-State Circuits · 2005 · 50 citations

Engineering, Computer Engineering, Computer Science +17

Face to Face Hybrid Wafer Bonding for Fine Pitch Applications

Daniel Fisher, Sarah H. Knickerbocker, Daniel M. Smith et al. · 2020 · 38 citations

Engineering, Manufacturing Engineering, Electronic Materials +12

A Self-Authenticating Chip Architecture Using an Intrinsic Fingerprint of Embedded DRAM

Sami Rosenblatt, Srivatsan Chellappa, Alberto Cestero et al. · IEEE Journal of Solid-State Circuits · 2013 · 35 citations

Engineering, Computer Engineering, Electrical Engineering +16

A Commercial Field-Programmable Dense eFUSE Array Memory with 99.999% Sense Yield for 45nm SOI CMOS

Greg Uhlmann, Tony Aipperspach, T. Kirihata et al. · 2008 · 27 citations

Engineering, Computer Engineering, Electrical Engineering +14