Robin Chao

Channel Geometry Impact and Narrow Sheet Effect of Stacked Nanosheet

Chun Wing Yeung, Jingyun Zhang, Robin Chao et al. · 2018 · 94 citations

Engineering, Electrical Engineering, Physics +17

High-k metal gate fundamental learning and multi-V<inf>t</inf> options for stacked nanosheet gate-all-around transistor

Jingyun Zhang, Takashi Ando, Chun Wing Yeung et al. · 2017 · 59 citations

Engineering, Electrical Engineering, Materials Science +17

Bias Temperature Instability Reliability in Stacked Gate-All-Around Nanosheet Transistor

Miaomiao Wang, Jingyun Zhang, Huimei Zhou et al. · 2019 · 31 citations

Engineering, Electrical Engineering, Microelectronics +16

Towards electrical testable SOI devices using Directed Self-Assembly for fin formation

Chi‐Chun Liu, Cristina Estrada-Raygoza, Hong He et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2014 · 20 citations

Engineering, Manufacturing Engineering, Electronic Materials +13

Electrical test prediction using hybrid metrology and machine learning

John G. Gaudiello, Susan Emans, Michael Shifrin et al. · 2017 · 17 citations

Engineering, Electrical Engineering, Manufacturing Engineering +17