K. Sakakibara

A quantitative analysis of time-decay reproducible stress-induced leakage current in SiO/sub 2/ films

K. Sakakibara, N. Ajika, K. Eikyu et al. · IEEE Transactions on Electron Devices · 1997 · 62 citations

Engineering, Silicon On Insulator, Semiconductor Device +16

Novel electron injection method using band-to-band tunneling induced hot electrons (BBHE) for flash memory with a P-channel cell

T. Ohnakado, K. Mitsunaga, Masahiro Nunoshita et al. · 2002 · 42 citations

Hardware Security, Non-volatile Memory, Electrical Engineering +14

A quantitative analysis of stress induced excess current (SIEC) in SiO/sub 2/ films

K. Sakakibara, N. Ajika, M. Hatanaka et al. · 1996 · 42 citations

Engineering, Silicon On Insulator, Semiconductor Device +17

Identification of stress-induced leakage current components and the corresponding trap models in SiO/sub 2/ films

K. Sakakibara, N. Ajika, M. Hatanaka et al. · IEEE Transactions on Electron Devices · 1997 · 35 citations

Engineering, Gate Voltage, Silicon On Insulator +17

Cyclotron-resonance studies of electronic properties in ZnSe

Takashi Ohyama, K. Sakakibara, E. Otsuka et al. · Physical review. B, Condensed matter · 1988 · 23 citations

Engineering, Excitation Energy Transfer, Electronic Properties +16