High performance 5nm radius Twin Silicon Nanowire MOSFET (TSNWFET) : fabrication on bulk si wafer, characteristics, and reliability

Sung Dae Suk, Sung‐Young Lee, Sungmin Kim, +15

Electrical EngineeringSaturation CurrentsEngineeringPhysicsBulk Si Wafer +11

Gate-All-Around (GAA) Twin Silicon Nanowire MOSFET (TSNWFET) with 15 nm Length Gate and 4 nm Radius Nanowires

Kyoung Hwan Yeo, Sung Dae Suk, Ming Li, +12

Gaa TsnwfetElectrical EngineeringNm Gate LengthEngineeringRf Semiconductor +10

Investigation of nanowire size dependency on TSNWFET

Sung Dae Suk, Ming Li, Yun Young Yeoh, +8

Device ModelingElectrical EngineeringEngineeringNanotechnologyNanoelectronics +9

Sub-10 nm gate-all-around CMOS nanowire transistors on bulk Si substrate

Ming Li, Kyoung Hwan Yeo, Sung Dae Suk, +5

Symposium on VLSI Technology

Electrical EngineeringEngineeringNanotechnologyNanoelectronicsApplied Physics +7

High-Performance Twin Silicon Nanowire MOSFET (TSNWFET) on Bulk Si Wafer

Sung Dae Suk, Kyoung Hwan Yeo, Keun Hwi Cho, +10

IEEE Transactions on Nanotechnology

Electrical EngineeringWafer Scale ProcessingEngineeringBulk Si WaferNanotechnology +10

Gate-all-around Twin Silicon nanowire SONOS Memory

Sung Dae Suk, Kyoung Hwan Yeo, Keun Hwi Cho, +10

SemiconductorsElectrical EngineeringEngineeringNanoelectronicsNanotechnology +9

Damascene gate FinFET SONOS memory implemented on bulk silicon wafer

Chang Woo Oh, Sung Dae Suk, Yong Kyu Lee, +14

Non-volatile MemoryElectrical EngineeringEngineeringMicrofabricationNanoelectronics +10

Observation of Single Electron Tunneling and Ballistic Transport in Twin Silicon Nanowire MOSFETs (TSNWFETs) Fabricated by Top-Down CMOS Process

Keun Hwi Cho, Sung Dae Suk, Yun Young Yeoh, +6

Device ModelingElectrical EngineeringBallistic TransportEngineeringTunneling Microscopy +13

Temperature-Dependent Characteristics of Cylindrical Gate-All-Around Twin Silicon Nanowire MOSFETs (TSNWFETs)

Keun Hwi Cho, Sung Dae Suk, Yun Young Yeoh, +8

IEEE Electron Device Letters

Device ModelingSemiconductorsElectrical EngineeringElectronic DevicesEngineering +11

TSNWFET for SRAM cell application: Performance variation and process dependency

Sung Dae Suk, Yun Young Yeoh, Ming Li, +5

Nw SramElectrical EngineeringEngineeringVlsi DesignStatic Noise Margin +13