2006 · 197 citations · 5 references
EngineeringElectrical EngineeringMaterials ScienceMicroelectronicsSemiconductor DevicesSemiconductor MaterialsDevice SimulationMetal-oxide-semiconductor Field-effect TransistorsNanoelectronicsNanowiresSemiconductor PhysicsShort-channel EffectsGate-all-around TransistorsNanoelectronic Device PhysicsNanowire DevicesNanowire Field-effect TransistorsNanowire TransistorsQuantum Device SimulationSemiconductor NanowiresSilicon Nanowires
GAA TSNWFET with 15 nm gate length and 4 nm radius nanowires is demonstrated and shows excellent short channel immunity. p-TSNWFET shows high driving current of 1.94 mA/mum while n-TSNWFET shows on-current of 1.44 mA/mum. Merits of TSNWFET and performance enhancement of p-TSNWFET are explored using 3D and quantum simulation
5
Fu-Liang Yang, Di-Hong Lee, Hou-Yu Chen et al. · 2004 · 249 citations
An advanced low power, high performance, strained channel 65nm technology