Amit Nahar

Quality improvement and cost reduction using statistical outlier methods

Amit Nahar, Kennet Butler, John M. Carulli et al. · 2009 · 36 citations

Management, Manufacturing Engineering, Quality Management +17

Burn-in reduction using principal component analysis

Amit Nahar, R. Daasch, Sharmila Subramaniam · 2006 · 31 citations

Computing, Computer Engineering, Burn Prevention +10

Die-level adaptive test: Real-time test reordering and elimination

Kapil Gotkhindikar, W.R. Daasch, Kenneth M. Butler et al. · 2011 · 22 citations

Engineering, Computer Engineering, Quality Assurance +6

Adapting to adaptive testing

Erik Jan Marinissen, Adit D. Singh, Dan Glotter et al. · 2010 · 21 citations

Engineering, Computer Engineering, Fault-tolerant Computing +6

Wafer-level process variation-driven probe-test flow selection for test cost reduction in analog/RF ICs

Ali Ahmadi, Amit Nahar, Bob Orr et al. · 2016 · 20 citations

Engineering, Computer Engineering, Electrical Engineering +12