R. Daasch

Screening minVDD outliers using feed-forward voltage testing

R. Madge, B. H. T. Goh, Venkatesh Rajagopalan et al. · 2003 · 67 citations

Engineering, Computer Engineering, Electrical Engineering +13

In search of the optimum test set - adaptive test methods for maximum defect coverage and lowest test cost

R. Madge, Brady Benware, Ritesh Turakhia et al. · 2005 · 56 citations

Management, Computer Engineering, Quality Assurance +15

Effectiveness comparisons of outlier screening methods for frequency dependent defects on complex ASICs

Brady Benware, R. Madge, Cheng-Tse Lu et al. · 2003 · 45 citations

Engineering, Computer Engineering, Electrical Engineering +16

Burn-in reduction using principal component analysis

Amit Nahar, R. Daasch, Sharmila Subramaniam · 2006 · 31 citations

Computing, Computer Engineering, Burn Prevention +10

Defect screening using independent component analysis on I/sub DDQ/

Ritesh Turakhia, Brady Benware, R. Madge et al. · 2005 · 22 citations

Computing, Computer Engineering, Computer-integrated Manufacturing +16