John M. Carulli

Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain

Ujjwal Guin, Ke Huang, Daniel DiMase et al. · Proceedings of the IEEE · 2014 · 543 citations

Engineering, Electrical Engineering, Supply Chain Management +15

Parametric counterfeit IC detection via Support Vector Machines

Ke Huang, John M. Carulli, Yiorgos Makris · 2012 · 83 citations

Engineering, Computer Engineering, Electrical Engineering +17

Impact of negative bias temperature instability on product parametric drift

V. Reddy, John M. Carulli, A.T. Krishnan et al. · 2005 · 70 citations

Engineering, Electrical Engineering, Microelectronics +15

Recycled IC Detection Based on Statistical Methods

Ke Huang, Yu Liu, Nenad Korolija et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2015 · 57 citations

Engineering, Computer Engineering, Electrical Engineering +17

Counterfeit electronics: A rising threat in the semiconductor manufacturing industry

Ke Huang, John M. Carulli, Yiorgos Makris · 2013 · 46 citations

Engineering, Electrical Engineering, Manufacturing Engineering +14