Chien-Fong Lo

Thermal Boundary Resistance in GaN Films Measured by Time Domain Thermoreflectance with Robust Monte Carlo Uncertainty Estimation

Thomas L. Bougher, Luke Yates, Chien-Fong Lo et al. · Nanoscale and Microscale Thermophysical Engineering · 2016 · 88 citations

Wide-bandgap Semiconductor, Layer Thickness, Electrical Engineering +15

Degradation Mechanisms for GaN and GaAs High Speed Transistors

David Cheney, E Douglas, Lu Liu et al. · Materials · 2012 · 44 citations · Full text

Materials Engineering, Reliability Issues, Electrical Engineering +13

Electric-Field-Driven Degradation in off-State Step-Stressed AlGaN/GaN High-Electron Mobility Transistors

Chih-Yang Chang, E Douglas, Jin-Hyung Kim et al. · IEEE Transactions on Device and Materials Reliability · 2011 · 42 citations

Wide-bandgap Semiconductor, Electrical Engineering, Engineering +9

Dependence on proton energy of degradation of AlGaN/GaN high electron mobility transistors

Lu Liu, Chien-Fong Lo, Yuyin Xi et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 2013 · 37 citations

Wide-bandgap Semiconductor, Electrical Engineering, Engineering +9

Thermal Performance of GaN/Si HEMTs Using Near-Bandgap Thermoreflectance Imaging

Georges Pavlidis, Luke Yates, Dustin Kendig et al. · IEEE Transactions on Electron Devices · 2020 · 34 citations

Wide-bandgap Semiconductor, Electrical Engineering, Engineering +13